This paper presents an evaluation of trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts.


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    Title :

    Overview of Device SEE Susceptibility From Heavy Ions


    Contributors:
    Nichols, D. (author) / Cross, J. (author) / McCarty, K. (author) / Schwartz, H. (author) / Smith, L. (author) / Swift, G. (author) / Watson, R. (author)

    Publication date :

    1993-07-19


    Type of media :

    Preprint


    Type of material :

    No indication


    Language :

    English




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