The authors collected a set of of heavy-ion single event upset test data since their last publications (ibid. vol.N5-32, no.6, p.4189, Dec. 1985). Earlier generalisations are extended to state-of-the art parts, and the statistical base for some of the previous parts classifications is expanded.


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    Title :

    Recent trends in parts SEU susceptibility from heavy ions


    Additional title:

    Entwicklungstrends beim Haerten von integrierten Halbleiterschaltungen gegenueber schwerer Ionenstrahlung


    Contributors:
    Nichols, D.K. (author) / Smith, L.S. (author) / Price, W.E. (author) / Koga, R. (author) / Kolasinski, W.A. (author)

    Published in:

    IEEE Transactions on Nuclear Science ; NS-34 , 6, PT.1 ; 1332-1337


    Publication date :

    1987


    Size :

    6 Seiten, 2 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




    Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions

    D. K. Nichols / L. S. Smith / W. E. Price et al. | NTIS | 1988


    Trends in parts susceptibility to single event upset from heavy ions

    Nichols, D. K. / Price, W. E. / Kolasinski, W. A. et al. | NTRS | 1986


    Update on Parts SEE Susceptibility from Heavy Ions

    D. K. Nickols / L. S. Smith / H. R. Schwartz et al. | NTIS | 1992


    Latching Current Limiter SEE Susceptibility from Heavy Ions

    Dias, Agnaldo Vieira / Manea, Silvio / Added, Nemitala et al. | IEEE | 2024


    Overview of Device SEE Susceptibility From Heavy Ions

    Nichols, D. / Cross, J. / McCarty, K. et al. | NTRS | 1993