New test data from the Jet Propulsion Laboratory (JPL), The Aerospace Corporation, Rockwell International (ANAHEIM) and IRT have been combined with published data of JPL and Aerospace to form a nearly comprehensive body of single event upset (SEU) test data for heavy ion irradiations. This data has been arranged to exhibit the SEU susceptibility of devices by function, technology and manufacturer. Clear trends emerge which should be useful in predicting future device performance.
Trends in parts susceptibility to single event upset from heavy ions
1986-05-15
Miscellaneous
No indication
English
Trends In Susceptibility To Single-Event Upset
NTRS | 1989
|Recent trends in parts SEU susceptibility from heavy ions
Tema Archive | 1987
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