JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their joint publication in December 1985. This report presented trends in SEU susceptibility for state-of-the-art parts. An ongoing single event upset (SEU) program at JPL and the Aerospace Corporation is continuing in order to assess specific parts performance in interplanetary and satellite environments and to establish trends in SEU response of many parts types. In 1985, Nichols et al (Ref. 1) published a nearly comprehensive listing of SEU test data for 186 parts. This large collection was sufficient to permit generalizations about the parts SEU susceptibility according to their technology, function, and manufacturer. In this report generalizations are extended to newer classes of parts and the statistical base for some of the previous parts classifications is expanded.


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    Title :

    Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions


    Contributors:
    D. K. Nichols (author) / L. S. Smith (author) / W. E. Price (author) / R. Koga (author) / W. A. Kolasinski (author)

    Publication date :

    1988


    Size :

    15 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




    Trends in parts susceptibility to single event upset from heavy ions

    Nichols, D. K. / Price, W. E. / Kolasinski, W. A. et al. | NTRS | 1986


    Trends In Susceptibility To Single-Event Upset

    Nichols, Donald K. / Price, William E. / Kolasinski, Wojciech A. et al. | NTRS | 1989


    Recent trends in parts SEU susceptibility from heavy ions

    Nichols, D.K. / Smith, L.S. / Price, W.E. et al. | Tema Archive | 1987


    SINGLE EVENT UPSET PROTECTION

    GEORGIN MARC J | European Patent Office | 2024

    Free access

    SINGLE EVENT UPSET PROTECTION

    GEORGIN MARC J | European Patent Office | 2024

    Free access