JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their joint publication in December 1985. This report presented trends in SEU susceptibility for state-of-the-art parts. An ongoing single event upset (SEU) program at JPL and the Aerospace Corporation is continuing in order to assess specific parts performance in interplanetary and satellite environments and to establish trends in SEU response of many parts types. In 1985, Nichols et al (Ref. 1) published a nearly comprehensive listing of SEU test data for 186 parts. This large collection was sufficient to permit generalizations about the parts SEU susceptibility according to their technology, function, and manufacturer. In this report generalizations are extended to newer classes of parts and the statistical base for some of the previous parts classifications is expanded.
Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions
1988
15 pages
Report
No indication
English
Trends In Susceptibility To Single-Event Upset
NTRS | 1989
|Recent trends in parts SEU susceptibility from heavy ions
Tema Archive | 1987
|