New test data from the Jet Propulsion Laboratory (JPL), The Aerospace Corporation, Rockwell International (ANAHEIM) and IRT have been combined with published data of JPL and Aerospace to form a nearly comprehensive body of single event upset (SEU) test data for heavy ion irradiations. This data has been arranged to exhibit the SEU susceptibility of devices by function, technology and manufacturer. Clear trends emerge which should be useful in predicting future device performance.


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    Titel :

    Trends in parts susceptibility to single event upset from heavy ions


    Beteiligte:
    Nichols, D. K. (Autor:in) / Price, W. E. (Autor:in) / Kolasinski, W. A. (Autor:in) / Koga, R. (Autor:in) / Pickel, J. C. (Autor:in) / Blandford, J. T., Jr. (Autor:in) / Waskiewicz, A. E. (Autor:in)

    Erscheinungsdatum :

    15.05.1986


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




    Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions

    D. K. Nichols / L. S. Smith / W. E. Price et al. | NTIS | 1988


    Trends In Susceptibility To Single-Event Upset

    Nichols, Donald K. / Price, William E. / Kolasinski, Wojciech A. et al. | NTRS | 1989


    Recent trends in parts SEU susceptibility from heavy ions

    Nichols, D.K. / Smith, L.S. / Price, W.E. et al. | Tema Archiv | 1987


    SINGLE EVENT UPSET PROTECTION

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    SINGLE EVENT UPSET PROTECTION

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