Jet Propulsion Laboratory (JPL) and The Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data since their last joint contributions to IEEE Transactions on Nuclear Science in December 1985, 1987, and 1989. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed. Single-event effects, Microcircuits, Space radiation.
Update on Parts SEE Susceptibility from Heavy Ions
1992
19 pages
Report
No indication
English
Recent trends in parts SEU susceptibility from heavy ions
Tema Archive | 1987
|Overview of Device SEE Susceptibility From Heavy Ions
NTRS | 1993
|