Jet Propulsion Laboratory (JPL) and The Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data since their last joint contributions to IEEE Transactions on Nuclear Science in December 1985, 1987, and 1989. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed. Single-event effects, Microcircuits, Space radiation.


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    Title :

    Update on Parts SEE Susceptibility from Heavy Ions


    Contributors:
    D. K. Nickols (author) / L. S. Smith (author) / H. R. Schwartz (author) / G. Soli (author) / K. Watson (author)

    Publication date :

    1992


    Size :

    19 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




    Recent trends in parts SEU susceptibility from heavy ions

    Nichols, D.K. / Smith, L.S. / Price, W.E. et al. | Tema Archive | 1987


    Trends in parts susceptibility to single event upset from heavy ions

    Nichols, D. K. / Price, W. E. / Kolasinski, W. A. et al. | NTRS | 1986


    Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions

    D. K. Nichols / L. S. Smith / W. E. Price et al. | NTIS | 1988


    Latching Current Limiter SEE Susceptibility from Heavy Ions

    Dias, Agnaldo Vieira / Manea, Silvio / Added, Nemitala et al. | IEEE | 2024


    Overview of Device SEE Susceptibility From Heavy Ions

    Nichols, D. / Cross, J. / McCarty, K. et al. | NTRS | 1993