This paper presents an evaluation of trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts.
Overview of Device SEE Susceptibility From Heavy Ions
19.07.1993
Preprint
Keine Angabe
Englisch
Update on Parts SEE Susceptibility from Heavy Ions
NTIS | 1992
|Recent trends in parts SEU susceptibility from heavy ions
Tema Archiv | 1987
|