This paper presents an evaluation of trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts.


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    Titel :

    Overview of Device SEE Susceptibility From Heavy Ions


    Beteiligte:
    Nichols, D. (Autor:in) / Cross, J. (Autor:in) / McCarty, K. (Autor:in) / Schwartz, H. (Autor:in) / Smith, L. (Autor:in) / Swift, G. (Autor:in) / Watson, R. (Autor:in)

    Erscheinungsdatum :

    19.07.1993


    Medientyp :

    Preprint


    Format :

    Keine Angabe


    Sprache :

    Englisch




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