1–48 von 48 Ergebnissen
|

    Single-event effects in avionics

    Normand, E. | Tema Archiv | 1996

    Radiation Hardness of TiO2 Memristive Junctions

    Tong, William M. / Yang, J.Joshua / Kuekes, Philip J. et al. | Tema Archiv | 2010

    Proton effects in charge-coupled devices

    Hopkinson, G.R. / Dale, C.J. / Marshall, P.W. | Tema Archiv | 1996

    Probability model for worst case solar proton event fluences

    Xapsos, M.A. / Summers, G.P. / Barth, J.L. et al. | Tema Archiv | 1999

    Single event gate rupture in thin gate oxides

    Sexton, F.W. / Fleetwood, D.M. / Shaneyfelt, M.R. et al. | Tema Archiv | 1997

    Optocouplers: fundamentals and hardness assurance for space applications

    Johnston, A.H. / Harris, R.D. / Miyahira, T.F. | Tema Archiv | 2009

    Radiation shielding study of advanced data and power management systems (ADPMS) housing using Geant4

    Garcia, F. / Kurvinen, K. / Brander, T. et al. | Tema Archiv | 2008

    A review of the techniques used for modeling single-event effects in power MOSFET's

    Johnson, G.H. / Palau, J.M. / Dachs, C. et al. | Tema Archiv | 1996

    Particle-induced bit errors in high performance fiber optic data links for satellite data management

    Marshall, P.W. / Dale, C.J. / Carts, M.A. et al. | Tema Archiv | 1994

    SRAM based re-programmable FPGA for space applications

    Wang, J.J. / Katz, R.B. / Sun, J.S. et al. | Tema Archiv | 1999

    Improved understanding of the earth's radiation belts from the CRRES satellite

    Gussenhoven, M.S. / Mullen, E.G. / Brautigam, D.H. | Tema Archiv | 1996

    Low LET cross-section measurements using high energy carbon beam (DRAMs/SRAMs)

    Ecoffet, R. / Duzellier, S. / Falguere, D. et al. | Tema Archiv | 1997

    Single-event effect ground test issues

    Koga, R. | Tema Archiv | 1996

    Single event latchup threshold estimation based on laser dose rate test results

    Chumakov, A.I. / Egorov, A.N. / Mavritsky, O.B. et al. | Tema Archiv | 1997

    Impact of aging on radiation hardness(CMOS SRAMs)

    Shaneyfelt, M.R. / Winokur, P.S. / Fleetwood, D.M. et al. | Tema Archiv | 1997

    Recent trends in single-event effect ground testing

    Duzellier, S. / Ecoffet, R. | Tema Archiv | 1996

    Single-event-effect mitigation from a system perspective

    LaBel, K.A. / Gates, M.M. | Tema Archiv | 1996

    New techniques for predicting solar proton fluences for radiation effects applications

    Xapsos, M.A. / Summers, G.P. / Shapiro, P. et al. | Tema Archiv | 1997

    The CRRES IDM spacecraft experiment for insulator discharge pulses

    Frederickson, A.R. / Mullen, E.G. / Kerns, K.J. et al. | Tema Archiv | 1993

    Radiation-induced two-step degradation of Si photoconductors and space solar cells

    Amekura, H. / Nishimoto, N. / Kono, K. | Tema Archiv | 1998

    Single event effects in analog-to-digital converters: device performance and system impact

    Turflinger, T.L. / Davey, M.V. / Mappes, B.M. | Tema Archiv | 1994

    The Proportional Counter Array (PCA) instrument for the X-ray Timing Explorer Satellite (XTE)

    Glasser, C.A. / Odell, C.E. / Seufert, S.E. | Tema Archiv | 1994

    SEU results from the advanced photovoltaic and electronics experiments (APEX) satellite

    Mullen, E.G. / Ray, K.P. / Koga, R. et al. | Tema Archiv | 1995

    High energy electron fluxmeter

    Dichter, B.K. / Hanser, F.A. / Sellers, B. et al. | Tema Archiv | 1993

    GRAS: a general-purpose 3-D Modular Simulation tool for space environment effects analysis

    Santin, G. / Ivanchenko, V. / Evans, H. et al. | Tema Archiv | 2005

    A neutron spectrometer for avionic environment investigations

    Hubert, G. / Trochet, P. / Riant, O. et al. | Tema Archiv | 2004

    Digital fuzzy control: a robust alternative suitable for space application

    Cheynet, P. / Velazco, R. / Rezgui, S. et al. | Tema Archiv | 1998

    Charge-collection mechanisms of AlGaAs/GaAs HBTs

    McMorrow, D. / Melinger, J.S. / Knudson, A.R. et al. | Tema Archiv | 1997

    Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories

    Harboe-Sorensen, R. / Guerre, F.X. / Loquet, J.G. et al. | Tema Archiv | 2003

    SEE data from the APEX cosmic ray upset experiment: Predicting the performance of commercial devices in space

    Adolphsen, J. / Barth, J.L. / Stassinopoulos, E.G. et al. | Tema Archiv | 1996

    The effects of funneling on space upset rate

    Langworthy, J.B. | Tema Archiv | 1993

    Single event effects and performance predictions for space applications of RISC processors

    Kimbrough, J.R. / Colella, N.J. / Denton, S.M. et al. | Tema Archiv | 1994

    A dc-coupled, high sensitivity bolometric detector system for the infrared telescope in space

    Devlin, M. / Lange, A.E. / Wilbanks, T. et al. | Tema Archiv | 1993