Basic mechanisms and ground-test data for radiation effects in solid-state-imagers are reviewed, with a special emphasis on proton-induced effects on silicon charge-coupled devices (CCDs). For the proton fluxes encountered in the space environment, both transient ionization and displacement damage effects arise from single-particle interactions. In the former case, individual proton tracks will be seen: in the latter, dark-current spikes (or hot pixels) and trapping states that cause degradation in charge-transfer efficiency will be observed. Proton-induced displacement damage effects on dark current and charge transfer are considered in detail, and the practical implications for shielding, device hardening, and ground testing are discussed.


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    Titel :

    Proton effects in charge-coupled devices


    Weitere Titelangaben:

    Protoneneffekte in ladungsgekoppelten Schaltungen


    Beteiligte:
    Hopkinson, G.R. (Autor:in) / Dale, C.J. (Autor:in) / Marshall, P.W. (Autor:in)

    Erschienen in:

    IEEE Transactions on Nuclear Science ; 43 , 2 Part I ; 614-627


    Erscheinungsdatum :

    1996


    Format / Umfang :

    14 Seiten, 12 Bilder, 1 Tabelle, 76 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch





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