Models developed for explaining the light flashes experienced by astronauts on Apollo and Skylab missions were used with slight modification to explain upsets observed in microelectronic circuits. Both phenomena can be explained by the simple assumption that an event occurs whenever a threshold number of ionizations or isomerizations are generated within a sensitive volume. Evidence is consistent with the threshold being sharp in both cases, but fluctuations in the physical stimuli lead to a gradual rather than sharp increase in cross section with LET. Successful use of the model requires knowledge of the dimensions of the sensitive volume and the value of threshold. Techniques have been developed to determine these SEU parameters in modern circuits.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Single-event effects experienced by astronauts and microelectronic circuits flown in space


    Weitere Titelangaben:

    Einzelereignisse und ihr Einfluß auf Astronauten und Mikroelektronikschaltungen


    Beteiligte:
    McNulty, P.J. (Autor:in)

    Erschienen in:

    IEEE Transactions on Nuclear Science ; 43 , 2 Part I ; 475-482


    Erscheinungsdatum :

    1996


    Format / Umfang :

    8 Seiten, 6 Bilder, 3 Tabellen, 52 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch