Monolithic Analog-to-Digital Converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis of data from a high-performance ADC demonstrates the type of errors and their potential impact on system performance. While SEEs in memory devices have been well characterized, the system impact of SEE in other complex electronic devices is not effectively characterized. This effort demonstrates that high-performance ADCs, which are used extensively in modern satellite systems, do indeed have a substantial SEE-induced error rate and that the error rate can be effectively characterized using reasonably simple modifications to well-known error rate calculations as used for memory devices.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Single event effects in analog-to-digital converters: device performance and system impact


    Weitere Titelangaben:

    Einzelereigniseffekte bei A/D-Konvertern: Geräteperformance und Systemauswirkung


    Beteiligte:
    Turflinger, T.L. (Autor:in) / Davey, M.V. (Autor:in) / Mappes, B.M. (Autor:in)


    Erscheinungsdatum :

    1994


    Format / Umfang :

    8 Seiten, 8 Bilder, 4 Tabellen, 5 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Photonic analog-to-digital converters

    Shoop, Barry L. | SPIE | 1998


    High Performance Analog-to-Digital Converters (ADCs) at Thomson TCS

    Wingender, M. | British Library Online Contents | 1997


    High Performance Analog-to-Digital Converters (ADCs) at Thomson TCS

    Wingender, M. / European Space Agency | British Library Conference Proceedings | 1997



    Effects of Crosstalk in Demultiplexers for Photonic Analog-to-Digital Converters

    Williamson, R. C. / Juodawlkis, P. W. / Wasserman, J. L. et al. | British Library Online Contents | 2001