For space applications, can cost-effective and reliable heavy ion single-event effect (SEE) testing still be carried out on commercially available, plastic packaged, high-density memories? Their complexity, architecture, and packaging assemblies as well as their short life cycle pose many practical problems that needs to be tackled. This paper summarizes steps taken by the European Space Agency in order to address these issues.
Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories
IEEE Transactions on Nuclear Science ; 50 , 6 ; 2322-2327
2003
6 Seiten, 9 Quellen
Aufsatz (Zeitschrift)
Englisch
Ultra-High-Density Ferroelectric Memories
NTRS | 1995
|Ultra-High-Density Ferroelectric Memories
Online Contents | 1995
Radiation tests of high-density memories
NTRS | 2002
|