Single event latchup is one of the dominant CMOS IC failure effects in the space environment. Latchup comparative experimental and software simulation research were performed at various laser wavelengths, pulse durations and spot sizes. Single event to dose rate latchup correlation was found that provides the possibility of SEL threshold energy prediction based on laser dose rate test results.


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    Titel :

    Single event latchup threshold estimation based on laser dose rate test results


    Beteiligte:
    Chumakov, A.I. (Autor:in) / Egorov, A.N. (Autor:in) / Mavritsky, O.B. (Autor:in) / Nikiforov, A.Y. (Autor:in) / Yanenko, A.V. (Autor:in)


    Erscheinungsdatum :

    1997


    Format / Umfang :

    6 Seiten, 9 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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