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    Title :

    Evaluating SEU effects in SRAM-based FPGA with bit-by-bit upset fault injection


    Contributors:
    Ningfang, S. (author) / Jiaomei, Q. (author) / Xiong, P. (author) / Yuntian, J. (author)


    Publication date :

    2012-01-01


    Size :

    5 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    629.4



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