Fault injection by emulation is a well-known method to analyze the reliability of a circuit. SRAM-based FPGAs provide the hardware infrastructure to implement fault injectors taking advantage of dynamic partial reconfiguration. This chapter presents the details of a Multiple Fault Injection Platform and the analysis of the configuration memory upsets of the FPGA. Results of fault injection campaigns are presented and compared with accelerated ground-level radiation experiments.


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    Title :

    Multiple Fault Injection Platform for SRAM-Based FPGA Based on Ground-Level Radiation Experiments




    Publication date :

    2016-01-01


    Size :

    17 pages




    Type of media :

    Article/Chapter (Book)


    Type of material :

    Electronic Resource


    Language :

    English




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