Fault injection by emulation is a well-known method to analyze the reliability of a circuit. SRAM-based FPGAs provide the hardware infrastructure to implement fault injectors taking advantage of dynamic partial reconfiguration. This chapter presents the details of a Multiple Fault Injection Platform and the analysis of the configuration memory upsets of the FPGA. Results of fault injection campaigns are presented and compared with accelerated ground-level radiation experiments.


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    Titel :

    Multiple Fault Injection Platform for SRAM-Based FPGA Based on Ground-Level Radiation Experiments


    Beteiligte:
    Kastensmidt, Fernanda (Herausgeber:in) / Rech, Paolo (Herausgeber:in) / Tonfat, Jorge (Autor:in) / Tarrillo, Jimmy (Autor:in) / Tambara, Lucas (Autor:in) / Kastensmidt, Fernanda Lima (Autor:in) / Reis, Ricardo (Autor:in)


    Erscheinungsdatum :

    01.01.2016


    Format / Umfang :

    17 pages




    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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