Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Single event upset mitigation testing of SRAM-based FPGAs


    Contributors:
    Yuguang, J. (author) / Jianwei, H. (author) / Xiang, Z. (author) / Minghui, C. (author)


    Publication date :

    2014-01-01


    Size :

    5 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    629.4



    Testing Electronic Devices for Single-Event Upset

    Nichols, D. K. / Price, W. E. / Malone, C. J. | NTRS | 1986


    Single event upset (SEU) testing at JPL

    Coss, James R. | NTRS | 1987


    Single event mitigation for Xilinx 7-series FPGAs

    Bates, T. / Bridges, C. P. | IEEE | 2018


    SINGLE EVENT UPSET PROTECTION

    GEORGIN MARC J | European Patent Office | 2024

    Free access

    Single Event Effects (SEE) Mitigation of Reconfigurable FPGAs

    Czajkowski, D. / Pagey, M. / Goksel, M. et al. | British Library Conference Proceedings | 2006