It is believed that the increase in SEUs with more modern devices may have serious consequences for future space missions. The physics behind an SEU is discussed as well as SEU test philosophy and equipment, and testing results. It is concluded that the problem may be ameliorated by careful device selection and the use of redundancy or error correction.


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    Title :

    Single event upset (SEU) testing at JPL


    Contributors:

    Conference:

    Aerospace Testing Seminar ; 1987 ; Los Angeles, CA, United States


    Publication date :

    1987-01-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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