We present heavy ion test results for a bipolar logic device of moderate complexity. Such devices require the implementation of special techniques for testing circuits of varying upset sensitivity, and unlike similar MOS devices, present problems with test data interpretation.


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    Title :

    Heavy-ion induced single event upsets in a bipolar logic device


    Additional title:

    Schwerioneninduzierte einzelne Umkippvorgaenge in bipolaren logischen Schaltkreisen


    Contributors:
    Kolasinski, W.A. (author) / Koga, R. (author)

    Published in:

    Publication date :

    1983


    Size :

    5 Seiten, 6 Bilder, 2 Tabellen, 11 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English





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