Report presents theory and experimental data regarding newly discovered mode for single-event upsets, (SEU's) in complementary metal-oxide/semiconductor, static random-access memories, CMOS SRAM's. SEU cross sections larger than those expected from previously known modes given rise to speculation regarding additional mode, and subsequent cross-section measurements appear to confirm speculation.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    New Mode For Single-Event Upsets


    Contributors:

    Published in:

    Publication date :

    1988-12-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    Single event upsets in space

    PETERSEN, E. | AIAA | 1983



    Estimating Rates Of Single-Event Upsets

    Zoutendyk, John A. | NTRS | 1988


    Anomalies due to single event upsets

    ROBINSON, JR., P. / LEE, W. / AGUERO, R. et al. | AIAA | 1990


    Anomalies due to Single Event Upsets

    Robinson, P. | Online Contents | 1994