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    Title :

    Applied SEE Test Data: Modern NAND Flash


    Contributors:
    Ted Wilcox (author) / Rebekah Austin (author)

    Conference:

    Single Event Effects (SEE) Symposium & Military and Aerospace Programmable Logic Devices (MAPLD) Combined Workshop ; 2023 ; San Diego, CA, US


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English



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