Applied SEE Test Data: Modern NAND Flash
Single Event Effects (SEE) Symposium & Military and Aerospace Programmable Logic Devices (MAPLD) Combined Workshop ; 2023 ; San Diego, CA, US
Miscellaneous
No indication
English
Springer Verlag | 2022
|COTS 3D NAND Flash: SEE Test Results and Challenges
NTRS | 2018
|Halbleiterindustrie: NAND-Flash-Markt in Bewegung
British Library Online Contents | 2012
NAND-Flash-Speicher: Schwaches zweites Quartal
British Library Online Contents | 2008
NAND-Flash-Speicher: Samsung in Xi'an
British Library Online Contents | 2012