Heavy-ion test data for 3D NAND flash memories is presented, along with a discussion of modern testing challenges and near-term plans for a broad survey of currently-available product lines.
COTS 3D NAND Flash: SEE Test Results and Challenges
2018 Single Event Effects (SEE) Symposium
;
2018
;
San Diego, CA, United States
Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
;
2018
;
San Diego, CA, United States
2018-05-21
Miscellaneous
No indication
English
Springer Verlag | 2022
|Halbleiterindustrie: NAND-Flash-Markt in Bewegung
British Library Online Contents | 2012
Reconfigurable COTS test systems
IEEE | 2000
|