Heavy-ion test data for 3D NAND flash memories is presented, along with a discussion of modern testing challenges and near-term plans for a broad survey of currently-available product lines.


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    Titel :

    COTS 3D NAND Flash: SEE Test Results and Challenges


    Beteiligte:

    Kongress:

    2018 Single Event Effects (SEE) Symposium ; 2018 ; San Diego, CA, United States
    Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2018 ; San Diego, CA, United States


    Erscheinungsdatum :

    21.05.2018


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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