We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results



    Conference:

    Nuclear and Space Radiation Effects Conference (NSREC) ; 2018 ; Waikoloa, HI, United States


    Publication date :

    2018-07-19


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    NASA Goddard Space Flight Center’s Compendium of Recent Single Event Effects Results

    M. V. O'Bryan / K. A. Label / E. P. Wilcox et al. | NTIS | 2018


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    Obryan, Martha V. / Label, Kenneth A. / Szabo, Carl M. et al. | NTRS | 2016


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    O'Bryan, Martha V. / LaBel, Kenneth A. / Szabo, Carl M. et al. | NTRS | 2016


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    M. V. Obryan / K. A. Label / J. A. Pellish et al. | NTIS | 2016