We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Titel :

    NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results


    Beteiligte:

    Kongress:

    Nuclear and Space Radiation Effects Conference (NSREC) ; 2018 ; Waikoloa, HI, United States


    Erscheinungsdatum :

    19.07.2018


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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