We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics.This paper is a summary of test results.


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    Titel :

    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center


    Beteiligte:

    Kongress:

    Nuclear and Space Radiation Effects Conference (NSREC) 2016 ; 2016 ; Portland, OR, United States


    Erscheinungsdatum :

    2016-07-11


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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