We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Titel :

    Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program


    Beteiligte:

    Kongress:

    2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017) ; 2017 ; New Orleans, LA, United States


    Erscheinungsdatum :

    17.07.2017


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch





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