We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Titel :

    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center


    Beteiligte:
    M. V. Obryan (Autor:in) / K. A. Label (Autor:in) / J. A. Pellish (Autor:in) / M. D. Berg (Autor:in) / C. M. Szabo (Autor:in) / D. Chen (Autor:in) / M. J. Campola (Autor:in) / M. C. Casey (Autor:in) / J. Lauenstein (Autor:in) / E. P. Wilcox (Autor:in)

    Erscheinungsdatum :

    2016


    Format / Umfang :

    12 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




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