We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Compendium of Single Event Effect Results from NASA Goddard Space Flight Center
2016
12 pages
Report
No indication
English
NASA Goddard Space Flight Center
NTRS | 2000
|NASA Goddard Space Flight Center
NTRS | 1977
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