We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Title :

    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center


    Contributors:
    M. V. Obryan (author) / K. A. Label (author) / J. A. Pellish (author) / M. D. Berg (author) / C. M. Szabo (author) / D. Chen (author) / M. J. Campola (author) / M. C. Casey (author) / J. Lauenstein (author) / E. P. Wilcox (author)

    Publication date :

    2016


    Size :

    12 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




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