We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Title :

    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center



    Conference:

    Nuclear and Space Radiation Effects Conference (NSREC), Radiation Effects Data Workshop ; 2016 ; Portland, OR, United States


    Publication date :

    2016-07-11


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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