We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4 field programmable gate array (FPGA).
Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data
Annual Single Event Effects (SEE) Symposium
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2016
;
La Jolla, CA, United States
Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
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2016
;
La Jolla, CA, United States
2016-05-23
Miscellaneous
No indication
English
Single event upset (SEU) testing at JPL
NTRS | 1987
|Testing Electronic Devices for Single-Event Upset
NTRS | 1986
|