We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4 field programmable gate array (FPGA).


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    Titel :

    Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data


    Beteiligte:
    Berg, Melanie (Autor:in) / Kim, Hak (Autor:in) / Phan, Anthony (Autor:in) / Seidleck, Christina (Autor:in) / LaBel, Ken (Autor:in)

    Kongress:

    Annual Single Event Effects (SEE) Symposium ; 2016 ; La Jolla, CA, United States
    Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2016 ; La Jolla, CA, United States


    Erscheinungsdatum :

    23.05.2016


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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