In this presentation, we provide a brief glimpse at preliminary single event test results taken from two years of testing of the Xilinx V5QV Field Programmable Gate Array (FPGA). This presentation includes an overview of test philosophy and implementation.


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    Titel :

    Independent Single Event Upset Testing of the Xilinx V5QV


    Beteiligte:
    Berg, Melanie D. (Autor:in) / Label, Kenneth A. (Autor:in) / Kim, Hak (Autor:in) / Phan, Anthony (Autor:in) / Seidleck, Christina (Autor:in)

    Kongress:

    Single Event Effects (SEE) Symposium and the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2014 ; La Jolla, CA, United States


    Erscheinungsdatum :

    19.05.2014


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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