This is a NASA Electronics Parts and Packaging (NEPP) independent investigation to determine the single event destructive and transient susceptibility of the Microsemi RTG4 device (DUT).
Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data
Annual Single Event Effects (SEE) Symposium
;
2016
;
San Diego, CA, United States
Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
;
2016
;
San Diego, CA, United States
26.06.2016
Sonstige
Keine Angabe
Englisch
Single event upset (SEU) testing at JPL
NTRS | 1987
|Testing Electronic Devices for Single-Event Upset
NTRS | 1986
|