This is a NASA Electronics Parts and Packaging (NEPP) independent investigation to determine the single event destructive and transient susceptibility of the Microsemi RTG4 device (DUT).


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    Titel :

    Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data


    Beteiligte:
    Berg, Melanie (Autor:in) / Kim, Hak (Autor:in) / Phan, Anthony (Autor:in) / Seidleck, Christina (Autor:in) / LaBel, Ken (Autor:in)

    Kongress:

    Annual Single Event Effects (SEE) Symposium ; 2016 ; San Diego, CA, United States
    Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2016 ; San Diego, CA, United States


    Erscheinungsdatum :

    26.06.2016


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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