We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to bit upsets. However the ReRAM system is vulnerable to SEFI.


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    Title :

    Single-Event Effect Performance of a Commercial ReRAM


    Contributors:

    Conference:

    (IEEE) Nuclear and Space Radiation Effects Conference (NSREC) ; 2014 ; Paris, France


    Publication date :

    2014-07-14


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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