We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to bit upsets. However the ReRAM system is vulnerable to SEFI.
Single-Event Effect Performance of a Commercial ReRAM
(IEEE) Nuclear and Space Radiation Effects Conference (NSREC) ; 2014 ; Paris, France
2014-07-14
Conference paper
No indication
English
Single-Event Effect Response of a Commercial ReRAM
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