We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to bit upsets. However the ReRAM system is vulnerable to SEFIs due to upsets in peripheral circuits, including the sense amplifier.
Single-Event Effect Response of a Commercial ReRAM
Single Event Effects (SEE) Symposium and the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2014 ; La Jolla, CA, United States
2014-05-19
Miscellaneous
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English
Single-Event Effect Performance of a Commercial ReRAM
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