Report presents test data on susceptibility of new set of digital integrated circuits and other semiconductor products to single-event effects (soft errors and latchups) caused by heavy ions incident at high energies. Data used to develop generalizations for protecting electronic equipment from single-event effects. In some cases, tested parts selected as candidates for use in specific applications.
Compiled Data On Single-Event Effects Caused By Heavy Ions
NASA Tech Briefs ; 20 , 4
1996-04-01
Miscellaneous
No indication
English
Compiled Data on Single-Event Effects Caused by Heavy Ions
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