Report presents test data on susceptibility of new set of digital integrated circuits and other semiconductor products to single-event effects (soft errors and latchups) caused by heavy ions incident at high energies. Data used to develop generalizations for protecting electronic equipment from single-event effects. In some cases, tested parts selected as candidates for use in specific applications.


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    Title :

    Compiled Data On Single-Event Effects Caused By Heavy Ions


    Contributors:

    Published in:

    Publication date :

    1996-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English