Report presents test data on susceptibility of new set of digital integrated circuits and other semiconductor products to single-event effects (soft errors and latchups) caused by heavy ions incident at high energies. Data used to develop generalizations for protecting electronic equipment from single-event effects. In some cases, tested parts selected as candidates for use in specific applications.


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    Titel :

    Compiled Data On Single-Event Effects Caused By Heavy Ions


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    01.04.1996



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch