Ballistic-electron-emission microscopy (BEEM) constitutes basis of new spectroscopy of scattering of electrons and holes. Pointed tip electrode scans near surface of metal about 100 angstrom thick on semiconductor. Principle similar to scanning tunneling microscope, except metal acts as third electrode. Used to investigate transport phenomena, scattering phenomena, and creation of hot charge carriers in Au/Si and Au/GaAs metal/semiconductor microstructures.


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    Title :

    Charge-Carrier-Scattering Spectroscopy With BEEM


    Contributors:

    Published in:

    Publication date :

    1992-09-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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