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    Title :

    Using BEEM To Probe Strains in Semiconductors


    Published in:

    Publication date :

    1996



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    BKL:    50.00 Technik allgemein: Allgemeines / 50.00 / 55.60 Raumfahrttechnik / 55.60



    Using BEEM To Probe Strains In Semiconductors

    Bell, L. Douglas / Milliken, Autumn M. / Manion, Stephen J. et al. | NTRS | 1996



    Charge-Carrier-Scattering Spectroscopy With BEEM

    Hecht, Michael H. / Bell, Lloyd D. / Kaiser, William J. | NTRS | 1992


    BEEM Spectroscopy and Imaging of Metal/GaN Interfaces

    Bell, L. D. / Smith, R. P. / McDermott, B. T. et al. | NTRS | 1998