Report evaluates effects of power and temperature overstress on General Semiconductor and Siemens devices. Mechanical disruption is prominent failure mode. Other failures are described.
JANTX1N2989B zener diode
NASA Tech Briefs ; 5 , 1
1980-08-01
Miscellaneous
No indication
English
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980