Report describes effects of power and temperature overstress on Motorola and Siemens diodes. Failure was predominantly due to melted metal on die connections. Other failures are described.
JANTX1N3031B zener diode
NASA Tech Briefs ; 5 , 1
1980-08-01
Miscellaneous
No indication
English
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980