Report evaluates effects of power and temperature overstress on General Semi-conductor and Siemens devices. Excessive failure rates limited testing. Failure modes are described.


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    Title :

    JANTX1N2970B zener diode


    Published in:

    Publication date :

    1980-08-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English