Report evaluates effects of power and temperature overstress on General Semi-conductor and Siemens devices. Excessive failure rates limited testing. Failure modes are described.
JANTX1N2970B zener diode
NASA Tech Briefs ; 5 , 1
1980-08-01
Sonstige
Keine Angabe
Englisch
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980