Report evaluates effects of power and temperature overstress on Motorola and Siemens devices. Reverse bias leakage maximum limit failure and Zener-breakdown maximum limit failure were common. Other failures are described.
JANTX1N3016B zener diode
NASA Tech Briefs ; 5 , 1
1980-08-01
Sonstige
Keine Angabe
Englisch
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980