Report evaluates effects of power and temperature overstress on General Semiconductor and Siemens devices. Mechanical disruption is prominent failure mode. Other failures are described.
JANTX1N2989B zener diode
NASA Tech Briefs ; 5 , 1
01.08.1980
Sonstige
Keine Angabe
Englisch
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980
NTRS | 1980