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    Title :

    Phenomenological Study of Radiation Damage and Recovery of Metal-Oxide Field Effect Transistors


    Contributors:

    Publication date :

    1966


    Size :

    13 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




    Phenomenological study of radiation damage and recovery of metal-oxide field effect transistors

    Desai, U. D. / Van Allen, R. L. / Wolfgang, J. L., Jr. | NTRS | 1967


    Phenomenological study of radiation damage and recovery of metal-oxide field effect transistors

    Desai, U. D. / Van Allen, R. L. / Wolfgang, J. L., Jr. | NTRS | 1966


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