1–20 von 48 Ergebnissen
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    The Proportional Counter Array (PCA) instrument for the X-ray Timing Explorer Satellite (XTE)

    Glasser, C.A. / Odell, C.E. / Seufert, S.E. | Tema Archiv | 1994

    The effects of funneling on space upset rate

    Langworthy, J.B. | Tema Archiv | 1993

    The CRRES IDM spacecraft experiment for insulator discharge pulses

    Frederickson, A.R. / Mullen, E.G. / Kerns, K.J. et al. | Tema Archiv | 1993

    SRAM based re-programmable FPGA for space applications

    Wang, J.J. / Katz, R.B. / Sun, J.S. et al. | Tema Archiv | 1999

    Single event latchup threshold estimation based on laser dose rate test results

    Chumakov, A.I. / Egorov, A.N. / Mavritsky, O.B. et al. | Tema Archiv | 1997

    Single event gate rupture in thin gate oxides

    Sexton, F.W. / Fleetwood, D.M. / Shaneyfelt, M.R. et al. | Tema Archiv | 1997

    Single-event effects in avionics

    Normand, E. | Tema Archiv | 1996

    Single event effects in analog-to-digital converters: device performance and system impact

    Turflinger, T.L. / Davey, M.V. / Mappes, B.M. | Tema Archiv | 1994

    Single event effects and performance predictions for space applications of RISC processors

    Kimbrough, J.R. / Colella, N.J. / Denton, S.M. et al. | Tema Archiv | 1994

    Single-event-effect mitigation from a system perspective

    LaBel, K.A. / Gates, M.M. | Tema Archiv | 1996

    Single-event effect ground test issues

    Koga, R. | Tema Archiv | 1996

    SEU results from the advanced photovoltaic and electronics experiments (APEX) satellite

    Mullen, E.G. / Ray, K.P. / Koga, R. et al. | Tema Archiv | 1995

    SEE data from the APEX cosmic ray upset experiment: Predicting the performance of commercial devices in space

    Adolphsen, J. / Barth, J.L. / Stassinopoulos, E.G. et al. | Tema Archiv | 1996