TID, SEE and radiation induced failures in advanced flash memories
2003 Non-volatile Memory Technology Symposium ; 2003 ; San Diego, CA, United States
01.11.2003
Aufsatz (Konferenz)
Keine Angabe
Englisch
flash memories , TID , SEE
TID radiation effects on flash memories
NTRS | 2002
|Evaluation of Radiation Effects in Flash Memories
NTRS | 1998
|AIAA | 1977
|