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    Title :

    TID, SEE and radiation induced failures in advanced flash memories


    Contributors:

    Conference:

    2003 Non-volatile Memory Technology Symposium ; 2003 ; San Diego, CA, United States


    Publication date :

    2003-11-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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    Evaluation of Radiation Effects in Flash Memories

    Miyahira, T. / Swift, G. | NTRS | 1998


    The effects of TID on wear-out of advanced flash memories

    Nguyen, D. / Scheick, L. / Swift, G. M. et al. | NTRS | 2000


    Advanced mass memories

    SCHWEE, L. / ANDERSON, W. / LIU, Y. et al. | AIAA | 1977